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  specification device name : type name : spec. no. : h04-004-07b igbt module 2MBI1200UG-170 ms5f 5932 ms5f5932 1 13 y.seki t.miyasaka t.nishimura sep. 30 ?04 sep. 30 ?04
2 h04-004-06b r e v i s e d r e c o r d s date classi- fication ind. content applied date drawn checked checked approved enactment issued date ms5f5932 13 y.seki t.miyasaka sep.-30-?04
h04-004-03a ms5f5932 13 2MBI1200UG-170 / pkg.no. m248 2. equivalent circuit 1. outline drawing ( unit : mm ) 3
h04-004-03a ms5f5932 13 4 3.absolute maximum ratings ( at tc= 25c unless otherwise specified ) tc=25c tc=80c tc=25c tc=80c (*1) all terminals should be connected together when isolation test will be done. (*2) recommendable value : mounting 4.25~5.75 nm (m6) main terminals 8~10 nm (m8) sense terminals 1.8~2.1 nm (m4) 4. electrical characteristics ( at tj= 25c unless otherwise specified) (*) biggest internal terminal resistance among arm. s sense terminals 2.1 vce=10v,vge=0v,f=1mhz -1.30 - n a screw torque *2 lead resistance, terminal-chip * mounting main terminals gate-emitter threshold voltage vge = 0v vce = 1700v iges ices input capacitance forward on voltage - m ? r lead - reverse recovery turn-on 0.25 rgon = 0.1 rgoff = 0.4 ? collector-emitter saturation voltage zero gate voltage collector current gate-emitter leakage current turn-off ton - vge=0v - 1.80 2.15 tj= 25c - toff vce(sat) (main terminal) - - vcc = 900v ic = 1200a vge=15v,tj=125c - cies tj=125c vf (main terminal) 0.40 - - tf trr - vf (sense terminal) tj= 25c - tj=125c if = 1200a 1700 ic icp 1 53 0 1200 30 60 2400 continuous v 20 v items symbols conditions vces collector-emitter voltage vges 1ms 3400 vac n m ac : 1min. -ic pulse pc tj a c w 1 device 150 -ic 1200 gate-emitter voltage collector current junction temperature collector power dissipation 2400 4960 1ms units max. typ. min. characteristics 5.75 10 tstg conditions storage temperature isolation voltage viso items symbols between terminal and copper base *1 -40 ~ +125 ic = 1200ma 1600 vce = 20v vge=20v vce = 0v -- - 5.5 1.0 ma v - 7.5 v6.5 units - 2.05 2.35 maximum ratings - 2.35 2.65 -2.70 2.40 - -1.50 2.10 2.30 2.45 v 2.00 s if = 1200a 0.45 - - 120 - n f - - vce(sat) (sense terminal) tj= 25c tj=125c tj= 25c tj=125c vge(th) vge=15v ic = 1200a tr - 0.75 -
h04-004-03a ms5f5932 13 5 5. thermal resistance characteristics * this is the value which is defined mounting on the additional cooling fin with thermal compo und. 6. indication on module logo of production sample.no. place of manufacturing (code) 7.applicable category this specification is applied to igbt module named 2MBI1200UG-170 . 8.storage and transportation notes ? the module should be stored at a standard temperature of 5 to 35c and humidity of 45 to 75% . ? store modules in a place with few temperature changes in order to avoid condensation on the module surface. ? avoid exposure to corrosive gases and dust. ? avoid excessive external force on the module. ? store modules with unprocessed terminals. ? do not drop or otherwise shock the modules when transporting. 9. definitions of switching time 10. packing and labeling display on the packing box - logo of production - type name - lot no - products quantity in a packing box items symbols conditions characteristics 0.006 units min. typ. max. igbt fwd - thermal resistance(1device) contact thermal resistance(1device) rth(j-c) rth(c-f) with thermal compound (*) - - lot.no. c/w 1200a / 1700v 2mbi1200ug-17 0 - 0.0252 - - 0.042 l vcc ic v ce r g v ge v ge v ce ic 0v 0a 0v 1 0% 90% 1 0% 1 0% 90% 90% 0v ic v ce on on on on t t t t r r r r t t t t r(i) r(i) r(i) r(i) t t t t off off off off t t t t f f f f t t t t rr rr rr rr i i i i rr rr rr rr t t t t
h04-004-03a ms5f5932 13 11. reliability test results 6 reliabilit y test items test cate- gories test items test methods and conditions reference norms eiaj ed-4701 (aug.-2001 edition) number of sample accept- ance number 1 terminal strength pull force : 40n test method 401 5 ( 0 : 1 ) (pull test) test time : 101 sec. method 2 mounting strength screw torque : 1.8 ~ 2.1 n ? m (m4) test method 402 5 ( 0 : 1 ) 4.25 ~ 5.75 n ? m (m6) method 8 ~ 10 n ? m (m8) test time : 101 sec. 3 vibration range of frequency : 10 ~ 500hz test method 403 5 ( 0 : 1 ) sweeping time : 15 min. reference 1 acceleration : 100m/s 2 condition code b sweeping direction : each x,y,z axis test time : 6 hr. (2hr./direction) 4 shock maximum acceleration : 1000m/s 2 test method 404 5 ( 0 : 1 ) pulse width : 6.0msec. condition code a direction : each x,y,z axis test time : 3 times/direction 1 high temperature storage temp. : 1255 test method 201 5 ( 0 : 1 ) storage test duration : 1000hr. 2 low temperature storage temp. : -405 test method 202 5 ( 0 : 1 ) storage test duration : 1000hr. 3 temperature storage temp. : 852 test method 103 5 ( 0 : 1 ) humidity relative humidity : 855% test code c storage test duration : 1000hr. 4 unsaturated test temp. : 120 2 test method 103 5 ( 0 : 1 ) pressurized vapor test humidity : 855% test code e test duration : 96hr. 5 temperature test method 105 5 ( 0 : 1 ) cycle test temp. : low temp. -40 5 high temp. 125 5 rt 5 ~ 35 dwell time : high ~ rt ~ low ~ rt 1hr. 0.5hr. 1hr. 0.5hr. number of cycles : 100 cycles 6 thermal shock +0 test method 307 5 ( 0 : 1 ) test temp. : high temp. 100 - 5 method +5 condition code a low temp. 0 - 0 used liquid : water with ice and bo iling water dipping time : 5 min. par each temp. transfer time : 10 sec. number of cycles : 10 cycles mechanical tests environment tests
h04-004-03a ms5f5932 13 reliabilit y test items test cate- gories test items test methods and conditions reference norms eiaj ed-4701 (aug.-2001 edition) number of sample accept- ance number 1 high temperature test method 101 5 ( 0 : 1 ) reverse bias test temp. : ta = 125 5 ( t j Q 150 ) bias voltage : vc = 0.8vces bias method : applied dc voltage to c-e vge = 0v test duration : 1000hr. 2 high temperature test method 101 5 ( 0 : 1 ) bias (for gate) test temp. : ta = 125 5 ( t j Q 150 ) bias voltage : vc = vge = +20v or -20v bias method : applied dc voltage to g-e vce = 0v test duration : 1000hr. 3 temperature test method 102 5 ( 0 : 1 ) humidity bias test temp. : 85 2 o c condition code c relative humidity : 85 5% bias voltage : vc = 0.8vces bias method : applied dc voltage to c-e vge = 0v test duration : 1000hr. 4 intermitted on time : 2 sec. test method 106 5 ( 0 : 1 ) operating life off time : 18 sec. (power cycle) test temp. : ? t j =1005 de g ( for igbt ) t j Q 150 , ta=255 number of cycles : 15000 cycles endurance tests endurance tests failure criteria item characteristic symbol failure criteria unit note lower limit upper limit electrical leakage current ices - usl2 ma characteristic iges - usl2 a gate threshold voltage vge(th) lsl0.8 usl1.2 ma saturation voltage vce(sat) - usl1.2 v forward voltage vf - usl1.2 v thermal igbt ? vge - usl1.2 mv resistance or ? vce fwd ? vf - usl1.2 mv isolation voltage viso broken insulation - visual visual inspection inspection peeling - the visual sample - plating and the others lsl : lower specified limit. usl : upper specified limit. note : each parameter measurement read-outs shall be made after stabilizing the components at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests. and in case of the wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry completely before the measurement. each parameter measurement read-outs shall be made after stabilizing the components at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests. and in case of the wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry completely before the measurement. 7
h04-004-03a ms5f5932 13 8 reliability test results test cate- gorie s test items reference norms eiaj ed-4701 (aug.-2001 edition) number of test sample number of failure sample 1 terminal strength test method 401 50 (pull test) method 2 mounting strength test method 402 50 method 3vibration test method 403 50 condition code b 4 shock test method 404 50 condition code a 1 high temperature storage test method 201 50 2 low temperature storage test method 202 50 3 temperature humidity test method 103 50 storage test code c 4 unsaturated test method 103 50 pressurized vapor test code e 5 temperature cycle test method 105 50 6 thermal shock test method 307 50 method condition code a 1 high temperature reverse bias test method 101 50 2 high temperature bias test method 101 50 ( for gate ) 3 temperature humidity bias test method 102 50 condition code c 4 intermitted operating life test method 106 50 (power cycling) ( for igbt ) mechanical tests environment tests endurance tests
h04-004-03a ms5f5932 13 9 collector-emitter voltage vs. gate-emitter voltage (typ.) capacitance vs. collector-emitter voltage (typ.) dynamic gate charge (typ.) collector current vs. collector-emitter voltage (typ.) vge=+15v,sense terminal tj=125c,sense terminal tj= 125c, sense terminal collector current vs. collector-emitter voltage (typ.) vge=0v, f= 1mhz, tj= 25c tj= 25c 0 400 800 1200 1600 2000 2400 2800 012345 collector current : ic [a] collector-emitter voltage : vce [v] tj=25c tj=125c 0 400 800 1200 1600 2000 2400 2800 012345 collector current : ic [a] collector-emitter voltage : vce [v] vge=20v 15v 12v 10v 9v 0 2 4 6 8 10 5 10152025 collector - emitter voltage : vce [ v ] gate - emitter voltage : vge [ v ] ic=2400a ic=1200a ic=600a 0.1 1.0 10.0 100.0 1000.0 0102030 ca p acitance : cies , coes , cres [ nf ] collector-emitter voltage : vce [v] cies coes cres 0 1000 2000 3000 4000 5000 collector-emitter voltage : vce [ 250v/div ] gate - emitter voltage : vge [ 5v/div ] gate charge : qg [ nc ] 0 vge vce
h04-004-03a ms5f5932 13 10 switching loss vs. gate resistance (typ.) vcc=900v, ic=1200a, vge=15v, tj= 125c reverse bias safe operating area (max.) switching time vs. collector current (typ.) vcc=900v, vge=15v, rgon=0.1 ? , rgoff=0.4 ? , tj= 25c vcc=900v, vge=15v, rgon=0.1 ? , rgoff=0.4 ? ,tj=125c switching time vs. gate resistance (typ.) switching loss vs. collector current (typ.) vcc=900v, ic=1200a, vge=15v, tj= 125c vge=15v, tj = 125c / chip 0.01 0.1 1 10 0 400 800 1200 1600 2000 switching time : ton, tr, toff, tf [ us ] collector current : ic [ a ] toff ton tf tr 0.1 1.0 10.0 100.0 0.1 1.0 10.0 100.0 switching time : ton, tr, toff, tf [ us ] gate resistance : rg [ ? ] tr tf toff ton 0 100 200 300 400 500 600 700 800 0 400 800 1200 1600 2000 switching loss : eon, eoff, err [ mj/pulse ] collector current : ic [ a ] , forward current : if [ a ] eon eoff err 0 400 800 1200 1600 2000 2400 2800 0.1 1.0 10.0 100.0 switching loss : eon, eoff, err [ mj/pulse ] gate resistance : rg [ ? ] eoff err eon 0 400 800 1200 1600 2000 2400 2800 0 500 1000 1500 2000 collector current : ic [ a ] collector - emitter voltage : vce [ v ]
h04-004-03a ms5f5932 13 11 transient thermal resistance (max.) reverse recovery characteristics (typ.) vcc=900v, vge=15v, rg=0.1 ? , tj=125c forward current vs. forward on voltage (typ.) sense terminal 0 400 800 1200 1600 2000 2400 2800 01234 forward current : if [ a ] forward on voltage : vf [ v ] tj=25c tj=125c 0 0 1 10 100 1000 10000 0 400 800 1200 1600 2000 reverse recovery current : irr [ a ] reverse recovery time : trr [ us ] forward current : if [ a ] trr irr 0.001 0.010 0.100 0.001 0.010 0.100 1.000 thermal resistanse : rth(j-c) [ c/w ] pulse width : pw [ sec ] fwd igbt
h04-004-03a ms5f5932 13 warnings - this product shall be used within its absolute maximum rating (voltage, current, and temperature). this product may be broken in case of using beyond the ratings. u?~???R?????~????????? ?? - connect adequate fuse or protector of circuit between three-phase line and this product to prevent the equipment from causing secondary destruction, such as fire, its spreading, or explosion. ?]1??????]??u?gm?`???``? ??k???? - use this product after realizing enough working on environment and considering of product's reliab ility life. this product may be broken before target life of the system in case of using beyond the product's reliab ility life. u??h????u?m????u?m?u?m ????????????? - if the product had been used in the environment with acid, organic matter, and corrosive gas ( hydrogen sulfide, sulfurous acid gas), the product's performance and appearance can not be ensured easily. ?C?????????h????u?C?Q?^??? - use this product within the power cycle curve (technical rep.no. : mt5f12959). power cycle capab ility is classified to delta-tj mode which is stated as above and delta-tc mode. delta-tc mode is due to rise and down of case temperature (tc), and depends on cooling design of equipment which use this product. in application which has such frequent rise and down of tc, well consideration of product life time is necessary. u???``? ( gY no.: mt5f 1 2959) ?`?? tj ? ?? tc ????`? (tc) ?N???????u???H ?O??`???N?l????u????? - never add mechanical stress to deform the main or control terminal. the deformed terminal may cause poor contact problem. ????????????????? - use this product with keeping the cooling fin's flatness between screw holes within 100um at 100mm and the roughness within 10um. also keep the tightening torque within the limits of this specification. too large convex of cooling fin may cause isolation breakdown and this may lead to a critical accident. on the other hand, too large concave of cooling fin makes gap between this product and the fin bigger, then, thermal conductivity will be worse and over heat destruction may occur. ??????g??? 100mm 100um ?? 10um ?^? ???u?~F????1??k????^???? u???g???????????? - in case of mounting this product on cooling fin, use thermal compound to secure thermal conductivity. if the thermal compound amount was not enough or its applying method was not suitable, its spreading w ill not be enough, then, thermal conductivity w ill be worse and thermal run away destruction may occur. confirm spreading state of the thermal compound when its applying to this product. (spreading state of the thermal compound can be confirmed by removing this product after mounting.) ?????H???_???????T?? Tm??????????o?????? ??TH??u????????_J? ( g???????????_J? ) - it shall be confirmed that igbt's operating locus of the turn-off voltage and current are within the rbsoa specification. this product may be broken if the locus is out of the rbsoa. `???R???E rbsoa ?????_J rbsoa ?????? ?? - if excessive static electricity is applied to the control terminals, the devices may be broken. implement some countermeasures against static electricity. ?^????????????Qr????g? 12
h04-004-03a ms5f5932 13 warnings - never add the excessive mechanical stress to the main or control terminals when the product is applied to equipments. the module structure may be broken. ????g?H???^???????? - in case of insufficient -vge, erroneous turn-on of igbt may occur. -vge shall be set enough value to prevent this malfunction. (recommended value : -vge = -15v) `?R -vge ??`?????`???? -vge ??? O?X : -vge = - 1 5v) - in case of higher turn-on dv/dt of igbt, erroneous turn-on of opposite arm igbt may occur. use this product in the most suitable drive conditions, such as +vge, -vge, rg to prevent the malfunction. `?? dv/dt ??``?????`????m?? +vge, -vge, rg ??? - this product may be broken by avalanche in case of vce beyond maximum rating vces is applied between c-e terminals. use this product within its absolute maximum voltage. vces ???R??????????? vce ? ~ ? cautions cautions cautions cautions - fuji electric device technology is constantly making every endeavor to improve the product quality and reliab ility. however, semiconductor products may rarely happen to fail or malfunction. to prevent accidents causing injury or death, damage to property like by fire, and other social damage resulted from a failure or malfunction of the fuji electric device technology semiconductor products, take some measures to keep safety such as redundant design, spread-fire-preventive design, and malfunction-protective design. ??C???`?~u??|m??????u???k? `????C???`u?u???`Y?1? ???b?p??p????LO????O??`?O????_ ?v - the application examples described in this specification only explain typical ones that used the fuji electric device technology products. this specification never ensure to enforce the industrial property and other rights, nor license the enforcement rights. ??d????C???`u?????h?? ????I??g??????g??SZ??? - the product described in this specification is not designed nor made for being applied to the equipment or systems used under life-threatening situations. when you consider applying the product of this specification to particular used, such as vehicle-mounted units, shipboard equipment, aerospace equipment, medical devices, atomic control systems and submarine relaying equipment or systems, please apply after confirmation of this product to be satisfied about system construction and required reliab ility. ??d?u?????r??C?????? ???O??u????????u??IC?C? @C??????????H?????| ?????_J? if there is any unclear matter in this specification, please contact fuji electric device technology co.,ltd. 13


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